Gaya APA

SPIE, I. (2019). Proceedings Of SPIE : Optical Technology and Measurement for Industrial Applications Conference Vol. 111412 (21 April 2019 Vol. 111412). Yokohama,Japan: SPIE.

Gaya MLA

SPIE, I.. Proceedings Of SPIE : Optical Technology and Measurement for Industrial Applications Conference Vol. 111412. 21 April 2019 Vol. 111412 Yokohama,Japan: SPIE, 2019. Jurnal Internasional.